Lewis Base Passivation Mediates Charge Transfer at Perovskite Heterojunctions

Understanding interfacial charge transfer processes such as trap-mediated recombination and injection into transport layers (CTLs) is crucial for the improvement of perovskite solar cells. Herein, we reveal that chemical binding to CH3NH3PbI3 defect sites an integral part mechanism in both n-i-p p-i-n architectures. Specifically, use a mixture optical X-ray photoelectron spectroscopy show interactions occur via Lewis base between electron-donating moieties on hole surface. We then correlate extent with yield longer lifetime injected holes transient absorption spectroscopy. Our results passivation-mediated has been occurring undetected some most common configurations elucidate key design rule structure next-generation CTLs.